Testing of assemblies

AOI, FKT, ICT – the testing of assemblies

Those who would like to undergo a comprehensive test once again for assemblies already produced or produced by our company can choose between a wide variety of tests. Thanks to our state-of-the-art equipment and our trained skilled workers, you can choose from the following test systems:

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Automatic Optical Inspection (AOI)

The Automatic Optical Inspection can detect production errors using state-of-the-art systems and innovative image processing techniques.

Functional test (FCT)

A functional test is the exact analysis and testing of the electronic components in terms of their functionality and their functional requirements.
This test is usually used in sample series and small series.

In-Circuit Test (ICT)

During the in-circuit test, the assemblies are placed on specially designed test adapters and a test is performed at component level.

Climate test

When conducting a climate test, the electronic assemblies are exposed to different climatic conditions and subsequently checked for damage or changes.

X-ray of the assemblies

With the help of high-resolution X-ray systems, we are able to check PCBs or individual components for their quality, longevity and functionality and, if necessary, develop solution proposals.

Flying Probe Test (FPT)

The flying probe test is an electronic test procedure that allows simultaneous in-circuit testing of the top and bottom surfaces.

Thermal Cycling Test (TCT)

The so-called temperature change test can be used to find out what effects and material changes will result from a frequent change of temperatures in the later field of application.

Burn-In Test

The burn-in test makes it possible to find in advance components that would not withstand continuous operation and thus lead to a total failure of the module. This test is a useful supplement to the previous electrical tests.

Boundary Scan

The Boundary Scan method uses additional cells that can be used to inject specific signals over previously defined external paths into the electronic assembly being tested.

We are happy to prepare a tailor-made examination plan for your product and advise you on useful functional tests.